Universal Compressive Characterization of Quantum Dynamics

Kim Y, Siah Teo Y, Ahn D, Im DG, Cho YW, Leuchs G, Sanchez-Soto LL, Jeong H, Kim YH (2020)

Publication Type: Journal article

Publication year: 2020

Journal

Physical Review Letters American Physical Society

Book Volume: 124

Article Number: 210401

Journal Issue: 21

DOI: 10.1103/PhysRevLett.124.210401

Abstract

Recent quantum technologies utilize complex multidimensional processes that govern the dynamics of quantum systems. We develop an adaptive diagonal-element-probing compression technique that feasibly characterizes any unknown quantum processes using much fewer measurements compared to conventional methods. This technique utilizes compressive projective measurements that are generalizable to an arbitrary number of subsystems. Both numerical analysis and experimental results with unitary gates demonstrate low measurement costs, of order O(d2) for d-dimensional systems, and robustness against statistical noise. Our work potentially paves the way for a reliable and highly compressive characterization of general quantum devices.

Authors with CRIS profile

Gerhard Leuchs

Involved external institutions

Pohang University of Science and Technology (POSTECH) KR Korea, Republic of (KR) Seoul National University (SNU) / 서울대학교 KR Korea, Republic of (KR) Korea Institute of Science and Technology (KIST) / 한국과학기술연구원 KR Korea, Republic of (KR) Max-Planck-Institut für die Physik des Lichts (MPL) / Max Planck Institute for the Science of Light DE Germany (DE)

How to cite

APA:

Kim, Y., Siah Teo, Y., Ahn, D., Im, D.-G., Cho, Y.-W., Leuchs, G.,... Kim, Y.-H. (2020). Universal Compressive Characterization of Quantum Dynamics. Physical Review Letters, 124(21). https://doi.org/10.1103/PhysRevLett.124.210401

MLA:

Kim, Yosep, et al. "Universal Compressive Characterization of Quantum Dynamics." Physical Review Letters 124.21 (2020).

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