GAN-based Defect Synthesis for Anomaly Detection in Fabrics
Rippel O, Muller M, Merhof D (2020)
Publication Type: Conference contribution
Publication year: 2020
Publisher: Institute of Electrical and Electronics Engineers Inc.
Book Volume: 2020-September
Pages Range: 534-540
Conference Proceedings Title: IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Event location: Vienna, AUT
ISBN: 9781728189567
DOI: 10.1109/ETFA46521.2020.9212099
Abstract
Image-based quality control aims at detecting anomalies in products and is a crucial part of the production process. Challenges arise from the complexity and variety of products, defects, and the rarity of defect occurrence. Quality control thus still relies heavily on manual inspection. Supervised, data driven approaches have greatly improved performance, but suffer from a major drawback: They require large amounts of annotated training data, limiting their economic viability.In this work, we overcome this drawback by leveraging the consistency of defect appearance across fabrics to transfer knowledge about anomalies from one fabric to another. We realize this by adapting the image-to-image translation framework, introducing guidance by means of a segmentation map. We evaluate both image quality as well as usability of generated defects. For the image quality, both classical (L1, L2 and Structured Similarity Measurement (SSIM)) and perceptual (Learned Perceptual Image Patch Similarity (LPIPS)) metrics indicate efficacy of the presented approach, i.e. defect synthesis only occurs in the targeted regions, and the background fabric pattern remains largely unchanged. To evaluate usability of generated defects, we train pseudo-supervised models on synthesized defects of fabrics unseen during training. A comparison with semi-supervised, autoencoder based approaches demonstrates the suitability of our approach, yielding average Area Under the Receiver Operating Characteristic Curve (AUROC) values of 0.81 for pseudo-supervised vs. 0.69 for semi-supervised settings.
Involved external institutions
Germany (DE)How to cite
APA:
Rippel, O., Muller, M., & Merhof, D. (2020). GAN-based Defect Synthesis for Anomaly Detection in Fabrics. In IEEE International Conference on Emerging Technologies and Factory Automation, ETFA (pp. 534-540). Vienna, AUT: Institute of Electrical and Electronics Engineers Inc..
MLA:
Rippel, Oliver, Maximilian Muller, and Dorit Merhof. "GAN-based Defect Synthesis for Anomaly Detection in Fabrics." Proceedings of the 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, AUT Institute of Electrical and Electronics Engineers Inc., 2020. 534-540.
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