Analysis of paper and board along the cross-section by Raman microscopy

Pigorsch E, Finger M, Gärtner G, Thiele S, Brunner E (2015)

Publication Type: Journal article

Publication year: 2015

Journal

ATIP. Association Technique de L'Industrie Papetiere Association Technique de l'Industrie Papetiere

Book Volume: 69

Pages Range: 14-18

Journal Issue: 3

Abstract

About ten years ago, improvements in the measuring technology of Raman spectroscopy led to its development from a purely scientific method into a routine laboratory procedure. Raman spectroscopy has significant advantages over other spectroscopic measurements and is particularly suitable for chemical analysis of paper which requires high local resolution and high chemical specificity. In combination with the already widely used scanning electron microscopy (SEM), Raman microscopy can provide new insights into the chemical structure of paper and board as it has not been possible by means of the analytical methods used so far.

Involved external institutions

Papiertechnische Stiftung DE Germany (DE) Technische Universität Dresden DE Germany (DE)

How to cite

APA:

Pigorsch, E., Finger, M., Gärtner, G., Thiele, S., & Brunner, E. (2015). Analysis of paper and board along the cross-section by Raman microscopy. ATIP. Association Technique de L'Industrie Papetiere, 69(3), 14-18.

MLA:

Pigorsch, E., et al. "Analysis of paper and board along the cross-section by Raman microscopy." ATIP. Association Technique de L'Industrie Papetiere 69.3 (2015): 14-18.

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