Detection of sub-pixel fractures in X-ray dark-field tomography

Lauridsen T, Willner M, Bech M, Pfeiffer F, Feidenhans'L R (2015)

Publication Type: Journal article

Publication year: 2015

Journal

Applied Physics A: Materials Science and Processing Springer Verlag (Germany)

Book Volume: 121

Pages Range: 1243-1250

Journal Issue: 3

DOI: 10.1007/s00339-015-9496-2

Abstract

We present a new method for detecting fractures in solid materials below the resolution given by the detector pixel size by using grating-based X-ray interferometry. The technique is particularly useful for detecting sub-pixel cracks in large samples where the size of the sample is preventing high-resolution μCT studies of the entire sample. The X-ray grating interferometer produces three distinct modality signals: absorption, phase and dark field. The method utilizes the unique scattering features of the dark-field signal. We have used tomograms reconstructed from each of the three signals to detect cracks in a model sample consisting of stearin.

Involved external institutions

University of Copenhagen DK Denmark (DK) Technische Universität München (TUM) DE Germany (DE) Lund University / Lunds universitet SE Sweden (SE)

How to cite

APA:

Lauridsen, T., Willner, M., Bech, M., Pfeiffer, F., & Feidenhans'L, R. (2015). Detection of sub-pixel fractures in X-ray dark-field tomography. Applied Physics A: Materials Science and Processing, 121(3), 1243-1250. https://doi.org/10.1007/s00339-015-9496-2

MLA:

Lauridsen, Torsten, et al. "Detection of sub-pixel fractures in X-ray dark-field tomography." Applied Physics A: Materials Science and Processing 121.3 (2015): 1243-1250.

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