Simulations of multi-contrast X-ray imaging using near-field speckles

Zdora MC, Thibault P, Herzen J, Pfeiffer F, Zanette I (2016)

Publication Type: Conference contribution

Publication year: 2016

Journal

AIP Conference Proceedings AIP Publishing

Publisher: American Institute of Physics Inc.

Book Volume: 1696

Conference Proceedings Title: AIP Conference Proceedings

Event location: Melbourne, VIC, AUS

ISBN: 9780735413436

DOI: 10.1063/1.4937510

Abstract

X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption X-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.

Involved external institutions

Technische Universität München (TUM) DE Germany (DE) University College London (UCL) GB United Kingdom (GB)

How to cite

APA:

Zdora, M.-C., Thibault, P., Herzen, J., Pfeiffer, F., & Zanette, I. (2016). Simulations of multi-contrast X-ray imaging using near-field speckles. In Martin D. de Jonge, David J. Paterson, Christopher G. Ryan (Eds.), AIP Conference Proceedings. Melbourne, VIC, AUS: American Institute of Physics Inc..

MLA:

Zdora, Marie-Christine, et al. "Simulations of multi-contrast X-ray imaging using near-field speckles." Proceedings of the 12th International Conference on X-Ray Microscopy, XRM 2014, Melbourne, VIC, AUS Ed. Martin D. de Jonge, David J. Paterson, Christopher G. Ryan, American Institute of Physics Inc., 2016.

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