Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing

Sellerer T, Ehn S, Mechlem K, Duda M, Epple M, Noel PB, Pfeiffer F (2019)


Publication Type: Journal article

Publication year: 2019

Journal

Book Volume: 14

Article Number: e0219659

Journal Issue: 7

DOI: 10.1371/journal.pone.0219659

Abstract

The recent progress in photon-counting detector technology using high-Z semiconductor sensors provides new possibilities for spectral x-ray imaging. The benefits of the approach to extract spectral information directly from measurements in the projection domain are very advantageous for material science studies with x-rays as polychromatic artifacts like beam-hardening are handled properly. Since related methods require accurate knowledge of all energy-dependent system parameters, we utilize an adapted semi-empirical model, which relies on a simple calibration procedure. The method enables a projection-based decomposition of photon-counting raw-data into basis material projections. The objective of this paper is to investigate the method’s performance applied to x-ray micro-CT with special focus on applications in material science and non-destructive testing. Projection-based dual-energy micro-CT is shown to be of good quantitative accuracy regarding material properties such as electron densities and effective atomic numbers. Furthermore, we show that the proposed approach strongly reduces beam-hardening artifacts and improves image contrast at constant measurement time.

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How to cite

APA:

Sellerer, T., Ehn, S., Mechlem, K., Duda, M., Epple, M., Noel, P.B., & Pfeiffer, F. (2019). Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing. PLoS ONE, 14(7). https://doi.org/10.1371/journal.pone.0219659

MLA:

Sellerer, Thorsten, et al. "Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing." PLoS ONE 14.7 (2019).

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