Device for source position stabilization and beam parameter monitoring at inverse Compton X-ray sources
Guenther B, Dierolf M, Achterhold K, Pfeiffer F (2019)
Publication Type: Journal article
Publication year: 2019
Journal
Book Volume: 26
Pages Range: 1546-1553
DOI: 10.1107/S1600577519006453
Abstract
Compact X-ray sources based on inverse Compton scattering provide brilliant and partially coherent X-rays in a laboratory environment. The cross section for inverse Compton scattering is very small, requiring high-power laser systems as well as small laser and electron beam sizes at the interaction point to generate sufficient flux. Therefore, these systems are very sensitive to distortions which change the overlap between the two beams. In order to monitor X-ray source position, size and flux in parallel to experiments, the beam-position monitor proposed here comprises a small knife edge whose image is acquired with an X-ray camera specifically designed to intercept only a very small fraction of the X-ray beam. Based on the source position drift recorded with the monitor, a closed-loop feedback stabilizes the X-ray source position by adjusting the laser beam trajectory. A decrease of long-term source position drifts by more than one order of magnitude is demonstrated with this device. Consequently, such a closed-loop feedback system which enables stabilization of source position drifts and flux of inverse Compton sources in parallel to experiments has a significant impact on the performance of these sources.
Involved external institutions
Germany (DE)How to cite
APA:
Guenther, B., Dierolf, M., Achterhold, K., & Pfeiffer, F. (2019). Device for source position stabilization and beam parameter monitoring at inverse Compton X-ray sources. Journal of Synchrotron Radiation, 26, 1546-1553. https://doi.org/10.1107/S1600577519006453
MLA:
Guenther, Benedikt, et al. "Device for source position stabilization and beam parameter monitoring at inverse Compton X-ray sources." Journal of Synchrotron Radiation 26 (2019): 1546-1553.
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