Full-field structured-illumination super-resolution X-ray transmission microscopy

Guenther B, Hehn L, Jud C, Hipp A, Dierolf M, Pfeiffer F (2019)

Publication Type: Journal article

Publication year: 2019

Journal

Nature Communications Nature Publishing Group: Nature Communications

Book Volume: 10

Article Number: 2494

Journal Issue: 1

DOI: 10.1038/s41467-019-10537-x

Abstract

Modern transmission X-ray microscopy techniques provide very high resolution at low and medium X-ray energies, but suffer from a limited field-of-view. If sub-micrometre resolution is desired, their field-of-view is typically limited to less than one millimetre. Although the field-of-view increases through combining multiple images from adjacent regions of the specimen, so does the required data acquisition time. Here, we present a method for fast full-field super-resolution transmission microscopy by structured illumination of the specimen. This technique is well-suited even for hard X-ray energies above 30 keV, where efficient optics are hard to obtain. Accordingly, investigation of optically thick specimen becomes possible with our method combining a wide field-of-view spanning multiple millimetres, or even centimetres, with sub-micron resolution and hard X-ray energies.

Involved external institutions

Technische Universität München (TUM) DE Germany (DE) Helmholtz-Zentrum Geesthacht Zentrum für Material- und Küstenforschung GmbH (HZG) DE Germany (DE)

How to cite

APA:

Guenther, B., Hehn, L., Jud, C., Hipp, A., Dierolf, M., & Pfeiffer, F. (2019). Full-field structured-illumination super-resolution X-ray transmission microscopy. Nature Communications, 10(1). https://doi.org/10.1038/s41467-019-10537-x

MLA:

Guenther, Benedikt, et al. "Full-field structured-illumination super-resolution X-ray transmission microscopy." Nature Communications 10.1 (2019).

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