Structural analysis of direct laser written waveguides

Salter PS, Jesacher A, Huang L, Liu X, Baum M, Alexeev I, Schmidt M, Booth MJ (2014)

Publication Type: Conference contribution

Publication year: 2014


Publisher: SPIE

Book Volume: 8968

Conference Proceedings Title: Proceedings of SPIE - The International Society for Optical Engineering

Event location: USA

ISBN: 9780819498816

DOI: 10.1117/12.2040422


We perform structural characterisation of direct laser write (DLW) waveguides. Quantitative phase microscopy, based on solution of the transfer of intensity equation, is used to measure the cumulative refractive index change through a waveguide perpendicular to its axis. Results are compared with interferometry, cross-sectional measurements using third harmonic microscopy, and analysis of the near-field image of the mode propagating in the waveguide. We show that in many situations, notably in the presence of depth dependent spherical aberrations, the cross-section for DLW waveguides may not be assumed symmetric about the waveguide axis. This is particularly important when fabricating at depths greater than 2 mm in fused silica. Therefore additional measurements are required to fully characterise the refractive index profile. © 2014 SPIE.

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Salter, P.S., Jesacher, A., Huang, L., Liu, X., Baum, M., Alexeev, I.,... Booth, M.J. (2014). Structural analysis of direct laser written waveguides. In Proceedings of SPIE - The International Society for Optical Engineering. USA: SPIE.


Salter, P. S., et al. "Structural analysis of direct laser written waveguides." Proceedings of the Laser-Based Micro- and Nanoprocessing VIII, USA SPIE, 2014.

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