Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices

Oleszczuk AS, Thouabtia M, Allinger M, Roeber J, Weigel R (2022)

Publication Type: Conference contribution

Publication year: 2022

Publisher: IEEE

City/Town: NEW YORK

Conference Proceedings Title: 2022 IEEE EUROPEAN TEST SYMPOSIUM (ETS 2022)

Event location: Barcelona ES

DOI: 10.1109/ETS54262.2022.9810455

Authors with CRIS profile

Robert Weigel Lehrstuhl für Technische Elektronik (LTE)

Involved external institutions

eesy-ic GmbH DE Germany (DE)

How to cite

APA:

Oleszczuk, A.S., Thouabtia, M., Allinger, M., Roeber, J., & Weigel, R. (2022). Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices. In 2022 IEEE EUROPEAN TEST SYMPOSIUM (ETS 2022). Barcelona, ES: NEW YORK: IEEE.

MLA:

Oleszczuk, Alexander Stephan, et al. "Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices." Proceedings of the 27th IEEE European Test Symposium (ETS), Barcelona NEW YORK: IEEE, 2022.

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