How Should IRSs Scale to Harden Multi-Antenna Channels?

Bereyhi A, Asaad S, Ouyang C, Müller R, Schaefer RF, Vincent Poor H (2022)

Publication Type: Conference contribution

Publication year: 2022

Publisher: IEEE Computer Society

Book Volume: 2022-June

Pages Range: 276-280

Conference Proceedings Title: Proceedings of the IEEE Sensor Array and Multichannel Signal Processing Workshop

Event location: Trondheim, NOR

ISBN: 9781665406338

DOI: 10.1109/SAM53842.2022.9827818

Abstract

This work extends the concept of channel hardening to multi-antenna systems that are aided by intelligent reflecting surfaces (IRSs). For fading links between a multi-antenna transmitter and a single-antenna receiver, we derive an accurate approximation for the distribution of the input-output mutual information when the number of reflecting elements grows large. The asymptotic results demonstrate that by increasing the number of elements on the IRS, the end-to-end channel hardens as long as the physical dimensions of the IRS grow as well. The growth rate however need not to be of a specific order and can be significantly sub-linear. The validity of the analytical result is confirmed by numerical experiments.

Authors with CRIS profile

Ali Bereyhi Lehrstuhl für Digitale Übertragung Saba Asaad Lehrstuhl für Digitale Übertragung Ralf Müller Professur für Informationsübertragung

Involved external institutions

Princeton University US United States (USA) (US) Universität Siegen DE Germany (DE) Beijing University of Posts and Telecommunications (BUPT) / 北京邮电大学 CN China (CN)

How to cite

APA:

Bereyhi, A., Asaad, S., Ouyang, C., Müller, R., Schaefer, R.F., & Vincent Poor, H. (2022). How Should IRSs Scale to Harden Multi-Antenna Channels? In Proceedings of the IEEE Sensor Array and Multichannel Signal Processing Workshop (pp. 276-280). Trondheim, NOR: IEEE Computer Society.

MLA:

Bereyhi, Ali, et al. "How Should IRSs Scale to Harden Multi-Antenna Channels?" Proceedings of the 12th IEEE Sensor Array and Multichannel Signal Processing Workshop, SAM 2022, Trondheim, NOR IEEE Computer Society, 2022. 276-280.

BibTeX: Download