Single-exposure X-ray phase imaging microscopy with a grating interferometer

Wolf A, Akstaller B, Cipiccia S, Flenner S, Hagemann J, Ludwig V, Meyer P, Schropp A, Schuster M, Seifert M, Weule M, Michel T, Anton G, Funk S (2022)

Publication Type: Journal article

Publication year: 2022


Book Volume: 29

Pages Range: 794-806

DOI: 10.1107/S160057752200193X


The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X-ray free-electron lasers where intrinsic pulse-to-pulse fluctuations pose a major challenge. In this work, the single-exposure phase imaging capabilities of grating interferometry are characterized by an implementation at the I13-1 beamline of Diamond Light Source (Oxfordshire, UK). For comparison purposes, propagation-based phase contrast imaging was also performed at the same instrument. The characterization is carried out in terms of the quantitativeness and the contrast-to-noise ratio of the phase reconstructions as well as via the achievable spatial resolution. By using a statistical image reconstruction scheme, previous limitations of grating interferometry regarding the spatial resolution can be mitigated as well as the experimental applicability of the technique.

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Wolf, A., Akstaller, B., Cipiccia, S., Flenner, S., Hagemann, J., Ludwig, V.,... Funk, S. (2022). Single-exposure X-ray phase imaging microscopy with a grating interferometer. Journal of Synchrotron Radiation, 29, 794-806.


Wolf, Andreas, et al. "Single-exposure X-ray phase imaging microscopy with a grating interferometer." Journal of Synchrotron Radiation 29 (2022): 794-806.

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