Exploring the Preparation Dependence of Crystalline 2D-Extended Ultrathin C8-BTBT-C8 Films

Hawly T, Johnson M, Späth A, Nickles Jäkel H, Wu M, Spiecker E, Watts B, Nefedov A, Fink R (2022)

Publication Type: Journal article

Publication year: 2022

Journal

ACS Applied Materials and Interfaces American Chemical Society

DOI: 10.1021/acsami.2c00097

Abstract

Crystalline organic semiconducting thin films from the benchmark molecule C8-BTBT-C8 were obtained using physical vapor deposition and various solution-based methods. Utilizing atomic force microscopy and X-ray spectromicroscopy, we illustrate the influence of the underlying growth mechanism and determine the highly preparation-dependent orientation of the thiophene backbone. We observe a continuous trend for crystalline C8-BTBT-C8 thin film domains to extend into the square millimeter-range under near-equilibrium growth conditions. For such well-defined systems, electron diffraction tomography allows us to precisely determine the unit cell directly after film deposition and to reveal an 8° molecular tilt angle with respect to the surface normal. This finding is in almost perfect accordance with the values derived from near-edge X-ray absorption fine structure linear dichroism. Within this work, we shine a light on both the successes and challenges connected to the realization of potent, thiophene-based semiconducting films, paving the way toward square centimeter-sized ultrathin organic crystals and their application in organic circuitry.

Authors with CRIS profile

Tim Hawly Professur für Physikalische Chemie Manuel Johnson Lehrstuhl für Physikalische Chemie II Andreas Späth Professur für Physikalische Chemie Hannah Nickles Jäkel Lehrstuhl für Physikalische Chemie II Mingjian Wu Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Erdmann Spiecker Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Rainer Fink Professur für Physikalische Chemie

Additional Organisation(s)

Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM) Nanoanalysis and Electron Microscopy (CENEM) Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Graduiertenkolleg 1896/2 In situ Mikroskopie mit Elektronen, Röntgenstrahlen und Rastersonden

Related research project(s)

In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896) Oct. 1, 2013 - Sept. 30, 2022

Involved external institutions

Karlsruhe Institute of Technology (KIT) DE Germany (DE) Paul Scherrer Institute (PSI) CH Switzerland (CH)

How to cite

APA:

Hawly, T., Johnson, M., Späth, A., Nickles Jäkel, H., Wu, M., Spiecker, E.,... Fink, R. (2022). Exploring the Preparation Dependence of Crystalline 2D-Extended Ultrathin C8-BTBT-C8 Films. ACS Applied Materials and Interfaces. https://doi.org/10.1021/acsami.2c00097

MLA:

Hawly, Tim, et al. "Exploring the Preparation Dependence of Crystalline 2D-Extended Ultrathin C8-BTBT-C8 Films." ACS Applied Materials and Interfaces (2022).

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