Complete Thermoelectric Characterization of PEDOT:PSS Thin Films with a Novel ZT Test Chip Platform

Linseis V, Hassan ZM, Reith H, Garcia J, Nielsch K, Baumgart H, Redel E, Woias P (2018)

Publication Type: Journal article

Publication year: 2018

Journal

physica status solidi (a) Wiley

Book Volume: 215

Article Number: 1700930

Journal Issue: 7

DOI: 10.1002/pssa.201700930

Abstract

For the first time, a complete thermoelectric characterization of PEDOT:PSS thin films is performed with a novel lab-on-a-chip measurement platform, which Is developed for the nearly simultaneous in-plane ZT characterization. The electrical conductivity, the Seebeck coefficient, the thermal conductivity, and consequently the power factor and ZT values as a function of temperature in a single measurement run is experimentally determined. A clear correlation is found between the film thickness of PEDOT:PSS and the thermoelectric properties. While the electrical conductivity increases with decreasing thickness, the thermal conductivity shows a contrary behavior. Both parameters increase monotonically with increasing temperature between 173 and 373 K. The Seebeck coefficient exhibits the same temperature dependency but, in contrast to the previous two parameters, is almost independent of the PEDOT:PSS film thickness. Furthermore, it is demonstrated that a ZT chip, with a complete set of thermoelectric test structures, can be successfully used for a full thermoelectric characterization of conductive organic thin films. This translates into a major testing time advantage for the screening and optimization of promising organic materials during the R&D phase, which can serve as potential candidates for future thermoelectric applications and devices.

Involved external institutions

Universität Hamburg (UHH) DE Germany (DE) Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden e.V. (IFW) / Leibniz Institute for Solid State and Materials Research Dresden DE Germany (DE) Old Dominion University US United States (USA) (US) Karlsruhe Institute of Technology (KIT) DE Germany (DE) Albert-Ludwigs-Universität Freiburg DE Germany (DE)

How to cite

APA:

Linseis, V., Hassan, Z.M., Reith, H., Garcia, J., Nielsch, K., Baumgart, H.,... Woias, P. (2018). Complete Thermoelectric Characterization of PEDOT:PSS Thin Films with a Novel ZT Test Chip Platform. physica status solidi (a), 215(7). https://doi.org/10.1002/pssa.201700930

MLA:

Linseis, Vincent, et al. "Complete Thermoelectric Characterization of PEDOT:PSS Thin Films with a Novel ZT Test Chip Platform." physica status solidi (a) 215.7 (2018).

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