Extended 3D X-ray nanotomography of low Z and porous materials to improve statistical significance and expand electron tomography studies

Englisch S, Wirth J, Drobek D, Apeleo Zubiri B, Spiecker E (2021)

Publication Type: Conference contribution, Original article

Publication year: 2021

Original Authors: Silvan Englisch,

Event location: Virtual

DOI: 10.22443/rms.emc2020.785

Abstract

In this study, we present a method to extend the 3D volume of X-ray nanotomography (Nano-CT) studies while keeping the highest possible resolution of about 50 nm in a lab-based system ZEISS Xradia 810 Ultra. Furthermore, we demonstrate the improvement of image quality and segmentation for different low Z and porous materials. The segmentation of 3D reconstructions additionally informed by electron microscopy and electron tomography (ET) data to combine the advantages of larger volumes in X-ray microscopy and higher resolution in electron microscopy.

Authors with CRIS profile

Silvan Englisch Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Janis Wirth Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Dominik Drobek Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Benjamin Apeleo Zubiri Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Erdmann Spiecker Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Related research project(s)

Microscopic 3D characterisation of functional particles and pore structures (SFB 1411 - C01) Design of particulate products (SFB 1411) Jan. 1, 2020 - Dec. 31, 2023

How to cite

APA:

Englisch, S., Wirth, J., Drobek, D., Apeleo Zubiri, B., & Spiecker, E. (2021). Extended 3D X-ray nanotomography of low Z and porous materials to improve statistical significance and expand electron tomography studies. In Proceedings of the European Microscopy Congress 2020. Virtual.

MLA:

Englisch, Silvan, et al. "Extended 3D X-ray nanotomography of low Z and porous materials to improve statistical significance and expand electron tomography studies." Proceedings of the European Microscopy Congress 2020, Virtual 2021.

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