Lattice Boltzmann simulations of stochastic thin film dewetting

Zitz S, Scagliarini A, Harting J (2021)

Publication Type: Journal article

Publication year: 2021

Journal

Physical Review E American Physical Society (APS)

Book Volume: 104

Article Number: 034801

Journal Issue: 3

DOI: 10.1103/PhysRevE.104.034801

Abstract

We study numerically the effect of thermal fluctuations and of variable fluid-substrate interactions on the spontaneous dewetting of thin liquid films. To this aim, we use a recently developed lattice Boltzmann method for thin liquid film flows, equipped with a properly devised stochastic term. While it is known that thermal fluctuations yield shorter rupture times, we show that this is a general feature of hydrophilic substrates, irrespective of the contact angle θ. The ratio between deterministic and stochastic rupture times, though, decreases with θ. Finally, we discuss the case of fluctuating thin film dewetting on chemically patterned substrates and its dependence on the form of the wettability gradients.

Authors with CRIS profile

Stefan Zitz Professur für Multiskalen-Modellierung für kontrollierte Filmbildung (HIERN) Jens Harting Professur für Multiskalen-Modellierung für kontrollierte Filmbildung (HIERN)

Involved external institutions

Consiglio Nazionale delle Ricerche (CNR) / National Research Council of Italy IT Italy (IT)

How to cite

APA:

Zitz, S., Scagliarini, A., & Harting, J. (2021). Lattice Boltzmann simulations of stochastic thin film dewetting. Physical Review E, 104(3). https://doi.org/10.1103/PhysRevE.104.034801

MLA:

Zitz, Stefan, A. Scagliarini, and Jens Harting. "Lattice Boltzmann simulations of stochastic thin film dewetting." Physical Review E 104.3 (2021).

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