Reflectance of VUV-sensitive SiPM surfaces in liquid xenon

Wagenpfeil M, Ziegler T, Fieguth A, Schneider J, Michel T, Weinheimer C (2019)

Publication Type: Journal article, Review article

Publication year: 2019

Journal

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Elsevier

Book Volume: 936

Pages Range: 577-579

DOI: 10.1016/j.nima.2018.09.142

Abstract

The nEXO experiment will operate an ultra-low background time projection chamber filled with 5t of isotopically enriched liquid xenon (LXe) for the search for the neutrinoless double beta decay in Xe-136. The detector will use 4m² of silicon photomultipliers (SiPMs) operated at about −104^∘C to collect the scintillation light. There are strong requirements on the background levels, light collection efficiency and SiPM performance to set the most stringent limits on the half-life. Detecting the 0νββ-decay would have wide-spread implications for neutrino physics. The SiPMs need to be sensitive to the vacuum-ultraviolet scintillation light of LXe at 178nm which is not given for off-the-shelf SiPMs. The SiPM performance requirements adopted by nEXO are (among others) a photon detection efficiency of at least 15% at 178nm, a correlated avalanche probability of less than 20% and a low dark-rate. Additionally, the VUV-reflectance of the SiPM surface in LXe is an important parameter for optimal light collection and thus the energy resolution of nEXO. We present measurements with state-of-the-art VUV-sensitive SiPMs focusing on the surface VUV-reflectance in liquid xenon.

Authors with CRIS profile

Michael Wagenpfeil Erlangen Centre for Astroparticle Physics (ECAP) Tobias Ziegler Lehrstuhl für Experimentelle Astroteilchenphysik Judith Schneider Lehrstuhl für Experimentelle Astroteilchenphysik Thilo Michel Lehrstuhl für Experimentelle Astroteilchenphysik

Involved external institutions

Westfälische Wilhelms-Universität (WWU) Münster

Germany (DE)

How to cite

APA:

Wagenpfeil, M., Ziegler, T., Fieguth, A., Schneider, J., Michel, T., & Weinheimer, C. (2019). Reflectance of VUV-sensitive SiPM surfaces in liquid xenon. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 936, 577-579. https://doi.org/10.1016/j.nima.2018.09.142

MLA:

Wagenpfeil, Michael, et al. "Reflectance of VUV-sensitive SiPM surfaces in liquid xenon." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 936 (2019): 577-579.

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