High-resolution millimeter-wave tomography system for characterization of low-permittivity materials

Och A, Holzl PA, Schuster S, Schrattenecker JO, Freidl PF, Scheiblhofer S, Zankl D, Pathuri-Bhuvana V, Weigel R (2020)

Publication Type: Conference contribution

Publication year: 2020

Journal

IEEE MTT-S International Microwave Symposium Digest Institute of Electrical and Electronics Engineers

Publisher: Institute of Electrical and Electronics Engineers Inc.

Book Volume: 2020-August

Pages Range: 365-368

Conference Proceedings Title: IEEE MTT-S International Microwave Symposium Digest

Event location: Virtual, Los Angeles, CA US

ISBN: 9781728168159

DOI: 10.1109/IMS30576.2020.9224048

Abstract

Tomographic microwave imaging is employed in numerous industrial applications, e.g., nondestructive testing. However, most existing systems are not suitable for measurements of low-permittivity materials such as gaseous substances or insulating foam with high air content. This paper introduces a 79 GHz high-resolution tomography system enabling characterization of materials with relative permittivity close to one. It is based on fully-integrated frequency-modulated continuous-wave radar transceivers which significantly reduce cost and complexity. A first prototype is built with two radar sensors and a rotary stage to emulate a higher sensor count. The medium-dependent time-of-flight through the area-under-test is evaluated and Tikhonov regularization is applied to solve the inverse problem and reconstruct a 2D image. System simulations and measurements with low-permittivity foam objects confirm the feasibility of this approach.

Authors with CRIS profile

Robert Weigel Lehrstuhl für Technische Elektronik

Additional Organisation(s)

Lehrstuhl für Technische Elektronik

Involved external institutions

Infineon Technologies Austria AG AT Austria (AT) Intel Austria AT Austria (AT) voestalpine Stahl GmbH AT Austria (AT) Silicon Austria Labs AT Austria (AT)

How to cite

APA:

Och, A., Holzl, P.A., Schuster, S., Schrattenecker, J.O., Freidl, P.F., Scheiblhofer, S.,... Weigel, R. (2020). High-resolution millimeter-wave tomography system for characterization of low-permittivity materials. In IEEE MTT-S International Microwave Symposium Digest (pp. 365-368). Virtual, Los Angeles, CA, US: Institute of Electrical and Electronics Engineers Inc..

MLA:

Och, Andreas, et al. "High-resolution millimeter-wave tomography system for characterization of low-permittivity materials." Proceedings of the 2020 IEEE/MTT-S International Microwave Symposium, IMS 2020, Virtual, Los Angeles, CA Institute of Electrical and Electronics Engineers Inc., 2020. 365-368.

BibTeX: Download