Hermann B, Guzenko VA, Hürzeler OR, Kirchner A, Orlandi GL, Prat E, Ischebeck R (2021)
Publication Type: Journal article
Publication year: 2021
Book Volume: 24
Article Number: 022802
Journal Issue: 2
DOI: 10.1103/PhysRevAccelBeams.24.022802
Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced acceleration experiments. Dielectric laser accelerators or plasma accelerators with external injection indeed require beam sizes at the micron level and below. We present a method using nano-fabricated metallic wires oriented at different angles to obtain projections of the transverse phase space by scanning the wires through the beam and detecting the amount of scattered particles. Performing this measurement at several locations along the waist allows assessing the transverse distribution at different phase advances. By applying a novel tomographic algorithm the transverse phase space density can be reconstructed. Measurements at the ACHIP chamber at SwissFEL confirm that the transverse phase space of micrometer-sized electron beams can be reliably characterized using this method.
APA:
Hermann, B., Guzenko, V.A., Hürzeler, O.R., Kirchner, A., Orlandi, G.L., Prat, E., & Ischebeck, R. (2021). Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution. Physical Review Accelerators and Beams, 24(2). https://doi.org/10.1103/PhysRevAccelBeams.24.022802
MLA:
Hermann, Benedikt, et al. "Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution." Physical Review Accelerators and Beams 24.2 (2021).
BibTeX: Download