Maximum likelihood reconstruction for grating-based X-ray microscopy

Wolf A, Schuster M, Ludwig V, Anton G, Funk S (2020)

Publication Type: Journal article

Publication year: 2020


Book Volume: 28

Pages Range: 13553-13568

Journal Issue: 9

DOI: 10.1364/OE.380940


The combination of grating-based phase-contrast imaging with X-ray microscopy can result in a complicated image formation. Generally, transverse shifts of the interference fringes are nonlinearly dependent on phase differences of the measured wave front. We present an iterative reconstruction scheme based on a regularized maximum likelihood cost function that fully takes this dependency into account. The scheme is validated by numerical simulations. It is particularly advantageous at low photon numbers and when the premises for deconvolution-based reconstructions are not met. Our reconstruction scheme hence enables a broader applicability of X-ray grating interferometry in imaging and wave front sensing.

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How to cite


Wolf, A., Schuster, M., Ludwig, V., Anton, G., & Funk, S. (2020). Maximum likelihood reconstruction for grating-based X-ray microscopy. Optics Express, 28(9), 13553-13568.


Wolf, Andreas, et al. "Maximum likelihood reconstruction for grating-based X-ray microscopy." Optics Express 28.9 (2020): 13553-13568.

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