Sensitive Direct Converting X-Ray Detectors Utilizing Crystalline CsPbBr3 Perovskite Films Fabricated via Scalable Melt Processing

Matt G, Levchuk I, Knüttel J, Dallmann J, Osvet A, Sytnyk M, Tang X, Elia J, Hock R, Heiß W, Brabec C (2020)


Publication Language: English

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2020

Journal

Publisher: WILEY

Book Volume: 7

Article Number: ARTN 1901575

Journal Issue: 4

DOI: 10.1002/admi.201901575

Abstract

Here the fabrication of an inorganic metal-halide perovskite CsPbBr3 based X-ray detector is reported utilizing a simple, scalable, and cost-sensitive melt processing directly on substrate of any size. X-ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm(2) range. The CsPbBr3 film features a resistance of 8.5 G omega cm and a hole mobility of 18 cm(2) V-1 s(-1). An X-ray to current conversion rate of 1450 mC Gy(air)(-1) cm(-2) at an electric field of 1.2 x 10(4) V cm(-1) and a detection limit in the sub mu Gy(air) s(-1) regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr3 films are suggested to be responsible for a performance which is on par to current state-of-the-art Cd(Zn)Te based X-ray detector technology.

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How to cite

APA:

Matt, G., Levchuk, I., Knüttel, J., Dallmann, J., Osvet, A., Sytnyk, M.,... Brabec, C. (2020). Sensitive Direct Converting X-Ray Detectors Utilizing Crystalline CsPbBr3 Perovskite Films Fabricated via Scalable Melt Processing. Advanced Materials Interfaces, 7(4). https://doi.org/10.1002/admi.201901575

MLA:

Matt, Gebhard, et al. "Sensitive Direct Converting X-Ray Detectors Utilizing Crystalline CsPbBr3 Perovskite Films Fabricated via Scalable Melt Processing." Advanced Materials Interfaces 7.4 (2020).

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