Innmann M, Kim K, Gu J, Nießner M, Loop C, Stamminger M, Kautz J (2020)
Publication Language: English
Publication Type: Conference contribution, Original article
Publication year: 2020
Publisher: IEEE
Pages Range: 2754 - 2763
Event location: Aspen, Colorado, USA
URI: https://www.lgdv.tf.fau.de/?p=1730
DOI: 10.1109/WACV45572.2020.9093583
Open Access Link: http://openaccess.thecvf.com/content_WACV_2020/papers/Innmann_NRMVS_Non-Rigid_Multi-view_Stereo_WACV_2020_paper.pdf
Multi-view Stereo (MVS) is a common solution in photogrammetry applications for the dense reconstruction of a static scene from images. The static scene assumption, however, limits the general applicability of MVS algorithms, as many day-to-day scenes undergo non-rigid motion, e.g., clothes, faces, or human bodies. In this paper, we open up a new challenging direction: Dense 3D reconstruction of scenes with non-rigid changes observed from a small number of images sparsely captured from different views with a single monocular camera, which we call non-rigid multi-view stereo (NRMVS) problem. We formulate this problem as a joint optimization of deformation and depth estimation, using deformation graphs as the underlying representation. We propose a new sparse 3D to 2D matching technique with a dense patch-match evaluation scheme to estimate the most plausible deformation field satisfying depth and photometric consistency. We show that a dense reconstruction of a scene with non-rigid changes from a few images is possible, and demonstrate that our method can be used to interpolate novel deformed scenes from various combinations of deformation estimates derived from the sparse views.
APA:
Innmann, M., Kim, K., Gu, J., Nießner, M., Loop, C., Stamminger, M., & Kautz, J. (2020). NRMVS: Non-Rigid Multi-View Stereo. In Proceedings of the IEEE Winter Conference on Applications of Computer Vision (WACV) (pp. 2754 - 2763). Aspen, Colorado, USA, US: IEEE.
MLA:
Innmann, Matthias, et al. "NRMVS: Non-Rigid Multi-View Stereo." Proceedings of the IEEE Winter Conference on Applications of Computer Vision (WACV), Aspen, Colorado, USA IEEE, 2020. 2754 - 2763.
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