High-Precision Localization of Trapped Microparticles inside Hollow-Core Photonic Crystal Fibers using Coherent Optical Frequency Domain Reflectometry

Köppel M, Sharma A, Renner E, Xie S, Schmauß B, Russell PSJ (2020)

Publication Type: Conference contribution, Conference Contribution

Publication year: 2020

Event location: Montreal, QC

ISBN: 978-1-7281-1634-1

URI: https://ieeexplore.ieee.org/document/8956583

DOI: 10.1109/SENSORS43011.2019.8956583

Abstract

We present a localization technique for an optically trapped microparticle inside hollow-core photonic crystal fibers which is the basis of a new generation of fiber optical sensors. A polystyrene particle of diameter ~15 µm is optically trapped and moved inside the hollow-core fiber by optical forces while its position is tracked using coherent optical frequency domain reflectometry. We demonstrate that this technique can locate the particle position with a standard deviation of ~10 µm. By applying a time-apertured Fourier transform, the dynamics of particle motion can be resolved with millisecond temporal resolution.

Authors with CRIS profile

Max Köppel Lehrstuhl für Hochfrequenztechnik Abhinav Sharma Lehrstuhl für Experimentalphysik (Alfried Krupp von Bohlen und Halbach-Professur) Esther Renner Lehrstuhl für Hochfrequenztechnik Bernhard Schmauß Professur für Hochfrequenztechnik mit dem Schwerpunkt Optische Hochfrequenztechnik und Photonik

Involved external institutions

Max-Planck-Institut für die Physik des Lichts (MPL) / Max Planck Institute for the Science of Light DE Germany (DE)

How to cite

APA:

Köppel, M., Sharma, A., Renner, E., Xie, S., Schmauß, B., & Russell, P.S.J. (2020). High-Precision Localization of Trapped Microparticles inside Hollow-Core Photonic Crystal Fibers using Coherent Optical Frequency Domain Reflectometry. In Proceedings of the 2019 IEEE SENSORS. Montreal, QC.

MLA:

Köppel, Max, et al. "High-Precision Localization of Trapped Microparticles inside Hollow-Core Photonic Crystal Fibers using Coherent Optical Frequency Domain Reflectometry." Proceedings of the 2019 IEEE SENSORS, Montreal, QC 2020.

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