Evidence of polyamorphic transitions during densified SiO2 glass annealing

Cornet A, Martinet C, Martinez V, de Ligny D (2019)

Publication Type: Journal article

Publication year: 2019

Journal

Journal of Chemical Physics AIP Publishing

Book Volume: 151

Article Number: 164502

Journal Issue: 16

DOI: 10.1063/1.5121534

Abstract

In situ X-ray scattering monitoring is carried out during temperature annealing on different densified SiO2 glasses. Density fluctuations and intermediate range coherence from X-ray scattering (small-angle X-ray scattering) and diffraction (wide angle X-ray scattering) evidence a maximum in their evolution at the same relaxation time. These extrema confirm the existence of an intermediate transitory disordered state between the two more ordered high and low density amorphous states. We propose that the existence of this transitory state confirms the existence of two mega basins in the energy landscape and therefore an amorphous-amorphous transition. Including older Raman results, we show that this intermediate disorder state implies similar mechanisms at all length scales from a few angstroms to 5 nm.

Authors with CRIS profile

Dominique de Ligny Professur für Werkstoffwissenschaften (Glas und Keramik)

Involved external institutions

Université Claude Bernard Lyon 1 (UCB) FR France (FR)

How to cite

APA:

Cornet, A., Martinet, C., Martinez, V., & de Ligny, D. (2019). Evidence of polyamorphic transitions during densified SiO2 glass annealing. Journal of Chemical Physics, 151(16). https://doi.org/10.1063/1.5121534

MLA:

Cornet, Antoine, et al. "Evidence of polyamorphic transitions during densified SiO2 glass annealing." Journal of Chemical Physics 151.16 (2019).

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