Influence of the PCB Manufacturing Process on the Measurement Error of Planar Relative Permittivity Sensors Up To 100 GHz

Lau I, Hajian A, Michler F, Gold G, Lurz F, Schmid U, Helmreich K, Weigel R, Kölpin A (2019)

Publication Language: English

Publication Type: Journal article, Original article

Publication year: 2019

Journal

IEEE Transactions on Microwave Theory and Techniques Institute of Electrical and Electronics Engineers (IEEE)

Book Volume: 67

Pages Range: 2793-2804

Journal Issue: 7

URI: https://ieeexplore.ieee.org/document/8698275

DOI: 10.1109/TMTT.2019.2910114

Abstract

Accurate and precise knowledge of the relative permittivity of printed circuit board (PCB) materials is essential for the reliable design of high-frequency circuits. For simplicity reasons, planar, resonant permittivity sensors, which are directly integrated on the unknown PCB material, are widely used. However, the sensors are affected by the nonidealities of the copper-clad laminate and PCB manufacturing process, e.g., the difference in roughness between the top and bottom sides of each metal layer. This paper analyzes the influence of these nonidealities on the extracted relative permittivity values of different sensor geometries in microstrip and substrate integrated waveguide (SIW) technology up to 100 GHz. Microstrip resonators are very sensitive against the investigated nonidealities. Additional roughness measurements and more detailed simulation models cannot noticeably reduce the uncertainties. SIW cavity sensors are more robust, and simple modeling approaches lead to low uncertainties smaller than 0.05 for the whole frequency range from 10 to 100 GHz.

Authors with CRIS profile

Isabella Lau Lehrstuhl für Technische Elektronik (LTE) Fabian Michler Lehrstuhl für Technische Elektronik (LTE) Gerald Gold Professur für Rechnergestützten Schaltungsentwurf Fabian Lurz Lehrstuhl für Technische Elektronik (LTE) Klaus Helmreich Professur für Rechnergestützten Schaltungsentwurf Robert Weigel Lehrstuhl für Technische Elektronik (LTE) Alexander Kölpin Lehrstuhl für Technische Elektronik (LTE)

Involved external institutions

Technische Universität Wien / Vienna University of Technology AT Austria (AT)

How to cite

APA:

Lau, I., Hajian, A., Michler, F., Gold, G., Lurz, F., Schmid, U.,... Kölpin, A. (2019). Influence of the PCB Manufacturing Process on the Measurement Error of Planar Relative Permittivity Sensors Up To 100 GHz. IEEE Transactions on Microwave Theory and Techniques, 67(7), 2793-2804. https://doi.org/10.1109/TMTT.2019.2910114

MLA:

Lau, Isabella, et al. "Influence of the PCB Manufacturing Process on the Measurement Error of Planar Relative Permittivity Sensors Up To 100 GHz." IEEE Transactions on Microwave Theory and Techniques 67.7 (2019): 2793-2804.

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