Advanced Interferometric SAR Techniques with TanDEM-X

Moreira A, Krieger G, Fiedler H, Hajnsek I, Younis M, Zink M, Werner M (2008)

Publication Type: Conference contribution

Publication year: 2008

Publisher: IEEE

Edited Volumes: 2008 IEEE Radar Conference, RADAR 2008

Article Number: 5

Conference Proceedings Title: IEEE Radar Conference (RadarCon)

Event location: Rome IT

ISBN: 9781424415397


DOI: 10.1109/RADAR.2008.4720737


TanDEM-X is an innovative mission with a TerraSAR-X add-on satellite for high-resolution single-pass SAR interferometry. The TanDEM-X mission has the primary objective of generating a consistent, global DEM with an unprecedented accuracy according to the HRTI-3 specifications (2m height accuracy, 12m posting). Beyond that, TanDEM-X provides a configurable SAR interferometric platform for demonstrating new SAR techniques and applications. The launch of TanDEM-X is planned for 2009. This paper gives a short overview of the TanDEM-X mission concept, summarizes the basic products and gives several examples of new interferometric techniques that will be demonstrated with TanDEM-X. © 2008 IEEE.

Authors with CRIS profile

Additional Organisation(s)

Involved external institutions

How to cite


Moreira, A., Krieger, G., Fiedler, H., Hajnsek, I., Younis, M., Zink, M., & Werner, M. (2008). Advanced Interferometric SAR Techniques with TanDEM-X. In IEEE Radar Conference (RadarCon). Rome, IT: IEEE.


Moreira, Alberto, et al. "Advanced Interferometric SAR Techniques with TanDEM-X." Proceedings of the 2008 IEEE Radar Conference, RADAR 2008, Rome IEEE, 2008.

BibTeX: Download