Model driven testing of embedded automotive systems with timed usage models

Siegl S, Hielscher KS, German R (2010)

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2010

Pages Range: 110-115

Article Number: 5550938

Event location: Qingdao

ISBN: 9781424471249

DOI: 10.1109/ICVES.2010.5550938

Authors with CRIS profile

Sebastian Siegl Graduiertenzentrum der FAU Kai-Steffen Hielscher Computer Science 7 (Computer Networks and Communication Systems) Reinhard German Computer Science 7 (Computer Networks and Communication Systems)

How to cite

APA:

Siegl, S., Hielscher, K.-S., & German, R. (2010). Model driven testing of embedded automotive systems with timed usage models. In Proceedings of the 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010 (pp. 110-115). Qingdao.

MLA:

Siegl, Sebastian, Kai-Steffen Hielscher, and Reinhard German. "Model driven testing of embedded automotive systems with timed usage models." Proceedings of the 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010, Qingdao 2010. 110-115.

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