Assessment of measurement deviations: length-extended x-ray imaging for orthopedic applications

Luckner C, Magdalena H, Ritschl L, Maier A, Kappler S (2019)

Publication Type: Conference contribution

Publication year: 2019

Book Volume: 10948

Pages Range: 1094839

Conference Proceedings Title: Medical Imaging 2019: Physics of Medical Imaging

Event location: San Diego, CA, USA

DOI: 10.1117/12.2511507

Authors with CRIS profile

Christoph Luckner Lehrstuhl für Informatik 14 (Bild- und Sprachverarbeitung) Andreas Maier Lehrstuhl für Informatik 5 (Mustererkennung)

Involved external institutions

Siemens AG, Healthcare Sector DE Germany (DE)

How to cite

APA:

Luckner, C., Magdalena, H., Ritschl, L., Maier, A., & Kappler, S. (2019). Assessment of measurement deviations: length-extended x-ray imaging for orthopedic applications. In Medical Imaging 2019: Physics of Medical Imaging (pp. 1094839). San Diego, CA, USA.

MLA:

Luckner, Christoph, et al. "Assessment of measurement deviations: length-extended x-ray imaging for orthopedic applications." Proceedings of the SPIE: Medical Imaging, San Diego, CA, USA 2019. 1094839.

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