In Situ and Analytical Transmission Electron Microscopy

Birajdar B, Spiecker E (2012)

Publication Type: Journal article

Publication year: 2012

Journal

Book Volume: 3

Pages Range: 25-27

URI: http://www.imaging-git.com/science/electron-and-ion-microscopy/situ-and-analytical-transmission-electron-microscopy

Abstract

In situ and analytical transmission electron microscopy (TEM) has been used to investigate the mechanism of material transport during Al-induced layer exchange (ALILE) and crystallization of amorphous Si (a-Si). Significant lateral and vertical redistribution of Al was observed, yielding Al deficient dendritic cell centers surrounded by an about 10 µm wide Al excess zone containing epitaxial islands of \dqpushed-up\dq Al whose number density and size decreases with increasing distance from the cell boundary.

Authors with CRIS profile

Balaji Birajdar
Erdmann Spiecker Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Additional Organisation(s)

Exzellenz-Cluster Engineering of Advanced Materials Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)

How to cite

APA:

Birajdar, B., & Spiecker, E. (2012). In Situ and Analytical Transmission Electron Microscopy. Imaging & Microscopy, 3, 25-27.

MLA:

Birajdar, Balaji, and Erdmann Spiecker. "In Situ and Analytical Transmission Electron Microscopy." Imaging & Microscopy 3 (2012): 25-27.

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