Local work function measurements of epitaxial graphene

Filleter T, Emtsev K, Seyller T, Bennewitz R (2008)

Publication Type: Journal article

Publication year: 2008


Book Volume: 93

Article Number: 133117

Journal Issue: 13

DOI: 10.1063/1.2993341


The work function difference between single layer and bilayer graphene grown epitaxially on 6H-SiC(0001) has been determined to be 135$±$9 meV by means of the Kelvin probe force microscopy. Bilayer films are found to increase the work function as compared to single layer films. This method allows an unambiguous distinction between interface layer, single layer, and bilayer graphene. In combination with high-resolution topographic imaging, the complex step structure of epitaxial graphene on SiC can be resolved with respect to substrate and graphene layer steps.

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Filleter, T., Emtsev, K., Seyller, T., & Bennewitz, R. (2008). Local work function measurements of epitaxial graphene. Applied Physics Letters, 93(13). https://dx.doi.org/10.1063/1.2993341


Filleter, Tobin, et al. "Local work function measurements of epitaxial graphene." Applied Physics Letters 93.13 (2008).

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