Buerhop C, Wirsching S, Gehre S, Pickel T, Winkler T, Bemm A, Mergheim J, Camus C, Brabec C, Hauch J (2017)
Publication Status: Published
Publication Type: Conference contribution, Conference Contribution
Publication year: 2017
Pages Range: 3500-3505
Conference Proceedings Title: Conference record of the IEEE Photovoltaic Specialists Conference
Event location: Washington, DC
The presence of pre-cracked PV-modules in modern PV-plants is well-known. The evolution and actual impact of the cracks on electrical yield under real operation conditions is not yet understood but of great relevance. Established standards cannot reveal the relevant effects. Therefore, a unique threefold analysis is applied: 1) field exposure, 2) using a new accelerated loading test, and 3) Finite Elements (FEM) simulations. For the first time, we present comparative Electroluminescence (EL-) images recorded in the field and during load testing. Crack growth is studied in terms of the monitored weather conditions and the applied load simulating static snow and wind loads.
APA:
Buerhop, C., Wirsching, S., Gehre, S., Pickel, T., Winkler, T., Bemm, A.,... Hauch, J. (2017). Lifetime and Degradation of Pre-damaged PV-Modules - Field study and lab testing. In IEEE (Eds.), Conference record of the IEEE Photovoltaic Specialists Conference (pp. 3500-3505). Washington, DC, US.
MLA:
Buerhop, Claudia, et al. "Lifetime and Degradation of Pre-damaged PV-Modules - Field study and lab testing." Proceedings of the 44th Photovoltaic Specialist Conference (PVSC), Washington, DC Ed. IEEE, 2017. 3500-3505.
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