System Identification Methods for Refined Fault Detection in LVDC-Microgrids

Strobl C, Schäfer M, Rabenstein R (2019)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2019

Event location: Matsue JP

Authors with CRIS profile

Maximilian Schäfer Lehrstuhl für Multimediakommunikation und Signalverarbeitung Rudolf Rabenstein Lehrstuhl für Multimediakommunikation und Signalverarbeitung

Involved external institutions

E-T-A Elektrotechnische Apparate GmbH DE Germany (DE)

How to cite

APA:

Strobl, C., Schäfer, M., & Rabenstein, R. (2019). System Identification Methods for Refined Fault Detection in LVDC-Microgrids. In Proceedings of the International Conference on DC Microgrids (ICDCM). Matsue, JP.

MLA:

Strobl, Christian, Maximilian Schäfer, and Rudolf Rabenstein. "System Identification Methods for Refined Fault Detection in LVDC-Microgrids." Proceedings of the International Conference on DC Microgrids (ICDCM), Matsue 2019.

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