Matern F, Riess C, Stamminger M (2019)
Publication Language: English
Publication Type: Conference contribution, Original article
Publication year: 2019
Publisher: IEEE
Pages Range: 83-92
Conference Proceedings Title: IEEE Workshop on Applications in Computer Vision
Event location: Waikoloa Village, HI
URI: https://faui1-files.cs.fau.de/public/mmsec/pub/matern_ivfws_2019_face_artifacts.pdf
Open Access Link: https://faui1-files.cs.fau.de/public/mmsec/pub/matern_ivfws_2019_face_artifacts.pdf
APA:
Matern, F., Riess, C., & Stamminger, M. (2019). Exploiting Visual Artifacts to Expose Deepfakes and Face Manipulations. In IEEE Workshop on Applications in Computer Vision (pp. 83-92). Waikoloa Village, HI, US: IEEE.
MLA:
Matern, Falko, Christian Riess, and Marc Stamminger. "Exploiting Visual Artifacts to Expose Deepfakes and Face Manipulations." Proceedings of the Workshop on Image and Video Forensics, Waikoloa Village, HI IEEE, 2019. 83-92.
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