Exploiting Visual Artifacts to Expose Deepfakes and Face Manipulations

Matern F, Riess C, Stamminger M (2019)


Publication Language: English

Publication Type: Conference contribution, Original article

Publication year: 2019

Publisher: IEEE

Pages Range: 83-92

Conference Proceedings Title: IEEE Workshop on Applications in Computer Vision

Event location: Waikoloa Village, HI US

URI: https://faui1-files.cs.fau.de/public/mmsec/pub/matern_ivfws_2019_face_artifacts.pdf

DOI: 10.1109/wacvw.2019.00020

Open Access Link: https://faui1-files.cs.fau.de/public/mmsec/pub/matern_ivfws_2019_face_artifacts.pdf

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How to cite

APA:

Matern, F., Riess, C., & Stamminger, M. (2019). Exploiting Visual Artifacts to Expose Deepfakes and Face Manipulations. In IEEE Workshop on Applications in Computer Vision (pp. 83-92). Waikoloa Village, HI, US: IEEE.

MLA:

Matern, Falko, Christian Riess, and Marc Stamminger. "Exploiting Visual Artifacts to Expose Deepfakes and Face Manipulations." Proceedings of the Workshop on Image and Video Forensics, Waikoloa Village, HI IEEE, 2019. 83-92.

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