New Orthogonalizing Boolean Equation using in the Calculation of Test Patterns for Combinatorial Circuits

Can Y, Fischer G (2015)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2015

Event location: Bursa TR

DOI: 10.1109/ELECO.2015.7394481

Abstract

In this paper a new Boolean equation for the orthogonalization of Boolean functions respectively of Ternary-Vector-Lists of disjunctive normal form is presented. It provides the mathematical solution of orthogonalization. The new equation is based on the new method of orthogonalizing OR-ing ∨ which enables
the building the union of two product terms respectively of two Ternary-Vectors whereby the result is orthogonal. The algorithm based on the new equation has a faster computation time in contrast to other methods. Further advantage is the smaller number of the product terms respectively of the Ternary-Vectors in the orthogonalized result which reduces the number of further calculation steps. Furthermore, the new equation can be used
as a part in the calculation procedure of getting suitable test patterns for combinatorial circuits for verifying feasible Logical faults.

Authors with CRIS profile

Yavuz Can Lehrstuhl für Zuverlässige Schaltungen und Systeme (LZS) Georg Fischer Professur für Technische Elektronik

How to cite

APA:

Can, Y., & Fischer, G. (2015). New Orthogonalizing Boolean Equation using in the Calculation of Test Patterns for Combinatorial Circuits. In Proceedings of the 9th International Conference on Electrical and Electronics Engineering (ELECO 2015), IEEE Turkey Section. Bursa, TR.

MLA:

Can, Yavuz, and Georg Fischer. "New Orthogonalizing Boolean Equation using in the Calculation of Test Patterns for Combinatorial Circuits." Proceedings of the 9th International Conference on Electrical and Electronics Engineering (ELECO 2015), IEEE Turkey Section, Bursa 2015.

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