Native point defects of semiconducting layered Bi2O2Se

Li H, Xu X, Zhang Y, Gillen R, Shi L, Robertson J (2018)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2018

Journal

Scientific Reports Nature Publishing Group: Open Access Journals - Option B

Publisher: Nature Publishing Group

Book Volume: 8

Article Number: 10920

Journal Issue: 1

DOI: 10.1038/s41598-018-29385-8

Authors with CRIS profile

Roland Gillen Lehrstuhl für Experimentalphysik

How to cite

APA:

Li, H., Xu, X., Zhang, Y., Gillen, R., Shi, L., & Robertson, J. (2018). Native point defects of semiconducting layered Bi2O2Se. Scientific Reports, 8(1). https://doi.org/10.1038/s41598-018-29385-8

MLA:

Li, Huanglong, et al. "Native point defects of semiconducting layered Bi2O2Se." Scientific Reports 8.1 (2018).

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