Mitra T, Teich J, Thiele L (2018)
Publication Language: English
Publication Type: Journal article, Editorial
Publication year: 2018
Book Volume: 35
Pages Range: 5 - 6
Journal Issue: 4
DOI: 10.1109/MDAT.2018.2841769
It is our pleasure to present Part II of the Special Issue on Time-Critical Systems Design that introduces, explores, and investigates the challenges and opportunities in supporting time criticality in computing systems. As mentioned in Part I of the special issue, we had received a total of 28 submissions, which was an overwhelmingly positive response illustrating the importance and the timely nature of the topic. We selected 12 articles from these submissions for publications in the special issue following rigorous peer review process. Six of these articles already appeared in Part I of the special issue in the March/April 2018 issue, and the remaining six appear in this issue.
APA:
Mitra, T., Teich, J., & Thiele, L. (2018). Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design Part II. IEEE Design and Test of Computers, 35(4), 5 - 6. https://doi.org/10.1109/MDAT.2018.2841769
MLA:
Mitra, Tulika, Jürgen Teich, and Lothar Thiele. "Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design Part II." IEEE Design and Test of Computers 35.4 (2018): 5 - 6.
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