A new calibration-free beam hardening reduction method for industrial CT

Würfl T, Maass N, Dennerlein F, Maier A (2018)

Publication Type: Conference contribution, Original article

Publication year: 2018

Pages Range: tbd

Conference Proceedings Title: Proceedings of the 8th Conference on Industrial Computed Tomography (iCT) 2018

Event location: Wels, Austria

URI: https://www5.informatik.uni-erlangen.de/Forschung/Publikationen/2018/Wurfl18-ANC.pdf

Authors with CRIS profile

Tobias Würfl Lehrstuhl für Informatik 5 (Mustererkennung) Andreas Maier Lehrstuhl für Informatik 5 (Mustererkennung)

Involved external institutions

Siemens AG, Healthcare Sector DE Germany (DE)

How to cite

APA:

Würfl, T., Maass, N., Dennerlein, F., & Maier, A. (2018). A new calibration-free beam hardening reduction method for industrial CT. In Proceedings of the 8th Conference on Industrial Computed Tomography (iCT) 2018 (pp. tbd). Wels, Austria.

MLA:

Würfl, Tobias, et al. "A new calibration-free beam hardening reduction method for industrial CT." Proceedings of the 8th Conference on Industrial Computed Tomography (iCT) 2018, Wels, Austria 2018. tbd.

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