Kühnel M, Falkner S, Großberger C, Ballhausen R, Dauser T, Schwarm FW, Kreykenbohm I, Nowak MA, Pottschmidt K, Ferrigno C, Rothschild RE, Martínez-Núñez S, Torrejón JM, Fürst F, Klochkov D, Staubert R, Kretschmar P, Wilms J (2016)
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2016
Publisher: Czech Technical University
Book Volume: 56
Pages Range: 41-46
Journal Issue: 1
DOI: 10.14311/APP.2016.56.0041
In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise.
APA:
Kühnel, M., Falkner, S., Großberger, C., Ballhausen, R., Dauser, T., Schwarm, F.-W.,... Wilms, J. (2016). The goodness of simultaneous fits in ISIS. Acta Polytechnica, 56(1), 41-46. https://doi.org/10.14311/APP.2016.56.0041
MLA:
Kühnel, Matthias, et al. "The goodness of simultaneous fits in ISIS." Acta Polytechnica 56.1 (2016): 41-46.
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