Sensing current and forces with SPM

Park JY, Maier S, Hendriksen B, Salmeron M (2010)

Publication Language: English

Publication Status: Published

Publication Type: Journal article

Publication year: 2010



Book Volume: 13

Pages Range: 38-45

Journal Issue: 10

DOI: 10.1016/S1369-7021(10)70185-1

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Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.

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How to cite


Park, J.Y., Maier, S., Hendriksen, B., & Salmeron, M. (2010). Sensing current and forces with SPM. Materials Today, 13(10), 38-45.


Park, Jeong Y., et al. "Sensing current and forces with SPM." Materials Today 13.10 (2010): 38-45.

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