Analyzing the degradation of pre-damaged PV-modules

Buerhop C, Winkler T, Wirsching S, Pickel T, Bemm A, Camus C, Hauch J, Brabec C (2017)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2017

Conference Proceedings Title: Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X

Event location: San Diego, CA US

DOI: 10.1117/12.2273978

Abstract

Cracked PV-modules are frequently detected in PV-systems. The impact of cracked cells on the energy yield and module performance under real operating conditions is not yet understood but of great relevance. Standard tests cannot reveal the relevant information conclusively. Therefore, we conducted a twofold analysis. 1) field exposure (global analysis on string level as well as detailed analysis on module level), and 2) load testing in the lab. Here, we present comparative electroluminescence (EL-) images recorded in an outdoor test stand and during load testing. Additionally, infrared (IR-) images as well as power data obtained from loaded and operating (field) conditions are discussed.

Authors with CRIS profile

Sven Wirsching Chair of Engineering Design Christoph Brabec Institute Materials for Electronics and Energy Technology (i-MEET)

Involved external institutions

Allianz Risk Consulting GmbH, AZT DE Germany (DE) Bayerisches Zentrum für Angewandte Energieforschung e.V. (ZAE Bayern) DE Germany (DE)

How to cite

APA:

Buerhop, C., Winkler, T., Wirsching, S., Pickel, T., Bemm, A., Camus, C.,... Brabec, C. (2017). Analyzing the degradation of pre-damaged PV-modules. In SPIE.DIGITAL LIBRARY (Eds.), Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X. San Diego, CA, US.

MLA:

Buerhop, Claudia, et al. "Analyzing the degradation of pre-damaged PV-modules." Proceedings of the SPIE Optical Engineering + Applications, San Diego, CA Ed. SPIE.DIGITAL LIBRARY, 2017.

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