Transverse and longitudinal characterization of electron beams using interaction with optical near-fields

Kozak M, McNeur J, Leedle K, Deng H, Schönenberger N, Ruehl A, Hartl I, Hoogland H, Holzwarth R, Harris J, Byer RL, Hommelhoff P (2016)

Publication Status: Published

Publication Type: Journal article

Publication year: 2016

Journal

Publisher: OPTICAL SOC AMER

Book Volume: 41

Pages Range: 3435-3438

Journal Issue: 15

URI: https://arxiv.org/abs/1611.09558

DOI: 10.1364/OL.41.003435

Abstract

We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution of 480 fs (sub-optical-cycle temporal regime is briefly discussed) achievable by this technique are demonstrated. (C) 2016 Optical Society of America

Authors with CRIS profile

Involved external institutions

Deutsches Elektronen-Synchrotron DESY Germany (DE) Stanford University United States (USA) (US) Menlo Systems GmbH Germany (DE)

How to cite

APA:

Kozak, M., McNeur, J., Leedle, K., Deng, H., Schönenberger, N., Ruehl, A.,... Hommelhoff, P. (2016). Transverse and longitudinal characterization of electron beams using interaction with optical near-fields. Optics Letters, 41(15), 3435-3438. https://doi.org/10.1364/OL.41.003435

MLA:

Kozak, Martin, et al. "Transverse and longitudinal characterization of electron beams using interaction with optical near-fields." Optics Letters 41.15 (2016): 3435-3438.

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