Abellan G, Wild S, Lloret V, Scheuschner N, Gillen R, Mundloch U, Maultzsch J, Varela M, Hauke F, Hirsch A (2017)
Publication Status: Published
Publication Type: Journal article
Publication year: 2017
Publisher: AMER CHEMICAL SOC
Book Volume: 139
Pages Range: 10432-10440
Journal Issue: 30
DOI: 10.1021/jacs.7b04971
Herein, we have developed a systematic study on the oxidation and passivation of mechanically exfoliated black phosphorus (BP). We analyzed the strong anisotropic behavior of BP by scanning Raman microscopy providing an accurate method for monitoring the oxidation of BP-via statistical Raman spectroscopy. Furthermore, different factors influencing the environmental instability of the BP, i.e., thickness, lateral dimensions or visible light illumination, have been investigated in detail. Finally, we discovered that the degradation of few-layer BP flakes of <10 nm can be suppressed for months by using ionic liquids, paving the way for the development of BP-based technologies.
APA:
Abellan, G., Wild, S., Lloret, V., Scheuschner, N., Gillen, R., Mundloch, U.,... Hirsch, A. (2017). Fundamental Insights into the Degradation and Stabilization of Thin Layer Black Phosphorus. Journal of the American Chemical Society, 139(30), 10432-10440. https://doi.org/10.1021/jacs.7b04971
MLA:
Abellan, Gonzalo, et al. "Fundamental Insights into the Degradation and Stabilization of Thin Layer Black Phosphorus." Journal of the American Chemical Society 139.30 (2017): 10432-10440.
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