Determination of the effective refractive index of nanoparticulate ITO layers
Baum M, Alexeev I, Latzel M, Christiansen S, Schmidt M (2013)
Publication Language: English
Publication Type: Journal article
Publication year: 2013
Journal
Publisher: Optical Society of America
Book Volume: 21
Pages Range: 22754--22761
Journal Issue: 19
DOI: 10.1364/OE.21.022754
Open Access Link: https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-21-19-22754
Abstract
Nanoparticles of transparent conducting oxides, such as indium tin oxide, can be used in printing techniques to generate functional layers for various optoelectronic devices. Since these deposition methods do not create fully consolidated films, the optical properties of such layers are expected to be notably different from those of the bulk material and should be characterized on their own. In this work we present a way to measure the effective refractive index of a particulate ITO layer by refraction of light. The obtained data points are used to identify an accurate layer model for spectroscopic ellipsometry. In this way the complex refractive index of the particle layer is determined in a wide spectral range from ultra violet to near infrared.
Authors with CRIS profile
Marcus Baum
Lehrstuhl für Photonische Technologien (LPT)
Ilya Alexeev
Lehrstuhl für Photonische Technologien (LPT)
Michael Schmidt
Lehrstuhl für Photonische Technologien (LPT)
Additional Organisation(s)
Erlangen Graduate School in Advanced Optical Technologies (SAOT)
Exzellenz-Cluster Engineering of Advanced Materials (EAM)
Involved external institutions
Germany (DE)How to cite
APA:
Baum, M., Alexeev, I., Latzel, M., Christiansen, S., & Schmidt, M. (2013). Determination of the effective refractive index of nanoparticulate ITO layers. Optics Express, 21(19), 22754--22761. https://doi.org/10.1364/OE.21.022754
MLA:
Baum, Marcus, et al. "Determination of the effective refractive index of nanoparticulate ITO layers." Optics Express 21.19 (2013): 22754--22761.
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