A Semi Double-Ridged quasi TE-Waveguide based Microwave Bulk Material Characterization System

Talai A, Mann S, Steinhäußer F, Bittner A, Schmid U, Weigel R, Kölpin A (2015)

Publication Type: Conference contribution

Publication year: 2015

Publisher: IEEE

Pages Range: 1-4

Event location: Phoenix, CA US

DOI: 10.1109/MWSYM.2015.7166937

Abstract

Accurate microwave material characterization is essential for reliable high frequency circuit design. Therefore, various characterization techniques have been developed, comprising advantages and drawbacks for the respective conditions. In this paper, a material characterization system is presented, which enables a broadband measurement for both dielectric loss and relative permittivity of bulk substrates with variant geometrical dimensions. A semi double-ridged waveguide is used to measure the introduced phase shift and dampening due to a strip of material, allowing a combined evaluation of the complex permittivity by measurement and simulation.

Authors with CRIS profile

Armin Talai Lehrstuhl für Technische Elektronik (LTE) Sebastian Mann Lehrstuhl für Technische Elektronik (LTE) Robert Weigel Lehrstuhl für Technische Elektronik (LTE) Alexander Kölpin Lehrstuhl für Technische Elektronik (LTE)

Involved external institutions

Technische Universität Wien / Vienna University of Technology AT Austria (AT)

How to cite

APA:

Talai, A., Mann, S., Steinhäußer, F., Bittner, A., Schmid, U., Weigel, R., & Kölpin, A. (2015). A Semi Double-Ridged quasi TE-Waveguide based Microwave Bulk Material Characterization System. In Proceedings of the IEEE MTT-S International Microwave Symposium (IMS) (pp. 1-4). Phoenix, CA, US: IEEE.

MLA:

Talai, Armin, et al. "A Semi Double-Ridged quasi TE-Waveguide based Microwave Bulk Material Characterization System." Proceedings of the IEEE MTT-S International Microwave Symposium (IMS), Phoenix, CA IEEE, 2015. 1-4.

BibTeX: Download