Influence of Temperature Distribution on Behavior, Modeling, and Reliability of BAW Resonators

Tag A, Karolewski D, Huck C, Bader B, Pitschi M, Wagner W, Schäffel C, Weigel R, Hagelauer AM (2014)

Publication Type: Conference contribution

Publication year: 2014

Publisher: IEEE

Pages Range: 5C.5.1-5C.5.7

Event location: Waikoloa, HI US

DOI: 10.1109/IRPS.2014.6860669

Authors with CRIS profile

Andreas Tag Lehrstuhl für Technische Elektronik Robert Weigel Lehrstuhl für Technische Elektronik Amelie Marietta Hagelauer Lehrstuhl für Technische Elektronik

How to cite

APA:

Tag, A., Karolewski, D., Huck, C., Bader, B., Pitschi, M., Wagner, W.,... Hagelauer, A.M. (2014). Influence of Temperature Distribution on Behavior, Modeling, and Reliability of BAW Resonators. In Proceedings of the IEEE International Reliability Physics Symposium (pp. 5C.5.1-5C.5.7). Waikoloa, HI, US: IEEE.

MLA:

Tag, Andreas, et al. "Influence of Temperature Distribution on Behavior, Modeling, and Reliability of BAW Resonators." Proceedings of the IEEE International Reliability Physics Symposium, Waikoloa, HI IEEE, 2014. 5C.5.1-5C.5.7.

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