Thinking Patterns and Intuition in the Technology Identification and Evaluation

Scheiner C, Baccarella C, Bessant J, Voigt KI (2012)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2012

Event location: Barcelona ES

Authors with CRIS profile

Christian Scheiner Lehrstuhl für Betriebswirtschaftslehre, insbesondere Industrielles Management Christian Baccarella Lehrstuhl für Betriebswirtschaftslehre, insbesondere Industrielles Management Kai-Ingo Voigt Lehrstuhl für Betriebswirtschaftslehre, insbesondere Industrielles Management

How to cite

APA:

Scheiner, C., Baccarella, C., Bessant, J., & Voigt, K.-I. (2012). Thinking Patterns and Intuition in the Technology Identification and Evaluation. In Proceedings of the International Society for Professional Innovation Management (ISPIM) Innovation Conference. Barcelona, ES.

MLA:

Scheiner, Christian, et al. "Thinking Patterns and Intuition in the Technology Identification and Evaluation." Proceedings of the International Society for Professional Innovation Management (ISPIM) Innovation Conference, Barcelona 2012.

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