Fauster T (1991)
Publication Status: Published
Publication Type: Journal article
Publication year: 1991
Publisher: Elsevier
Book Volume: 254
Pages Range: 58-64
DOI: 10.1016/0039-6028(91)90637-8
During epitaxial growth of Fe on Cu(100) the normalized Auger signal of Fe was taken as a function of evaporation time. This curve shows evidence for a layer-by-layer growth mode and clearly rules out other possible growth modes. Rutherford backscattering spectrometry was used to determine thicknesses of a one- and two-layer film quantitatively with an accuracy of +/- 0.3 ML. These data together with the Auger analysis unveil a bilayer-by-bilayer growth mode for the first two bilayers.
APA:
Fauster, T. (1991). BILAYER GROWTH IN A METALLIC SYSTEM - FE ON CU(100). Surface Science, 254, 58-64. https://doi.org/10.1016/0039-6028(91)90637-8
MLA:
Fauster, Thomas. "BILAYER GROWTH IN A METALLIC SYSTEM - FE ON CU(100)." Surface Science 254 (1991): 58-64.
BibTeX: Download