Thomas S, Krüger M, Förster M, Schenk M, Hommelhoff P (2013)
Publication Type: Journal article
Publication year: 2013
Book Volume: 13
Pages Range: 4790-4794
DOI: 10.1021/nl402407r
APA:
Thomas, S., Krüger, M., Förster, M., Schenk, M., & Hommelhoff, P. (2013). Probing of optical near-fields by electron rescattering on the 1nm scale. Nano Letters, 13, 4790-4794. https://doi.org/10.1021/nl402407r
MLA:
Thomas, Sebastian, et al. "Probing of optical near-fields by electron rescattering on the 1nm scale." Nano Letters 13 (2013): 4790-4794.
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