Single- and Dual-Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors

Nasr I, Nehring J, Aufinger K, Fischer G, Weigel R, Kissinger D (2014)

Publication Type: Journal article

Publication year: 2014

Journal

IEEE Transactions on Microwave Theory and Techniques Institute of Electrical and Electronics Engineers (IEEE)

Publisher: IEEE

Book Volume: 62

Pages Range: 2168-2179

Journal Issue: 9

DOI: 10.1109/TMTT.2014.2337264

Abstract

This work presents a single- and dual-port fully integrated millimeter-wave ultra-broadband vector network analyzer. Both circuits, realized in a commercial ${hbox{0.35-}}mu{hbox {m}}$ SiGe:C technology with an $f_{t}/f_{max}$ of ${hbox{170/250 GHz}}$, cover an octave frequency bandwidth between 50–100 GHz. The presented chips can be configured to measure complex scattering parameters of external devices or determine the permittivity of different materials using an integrated millimeter-wave dielectric sensor. Both devices are based on a heterodyne architecture that achieves a receiver dynamic range of 57–72.5 dB over the complete design frequency range. Two integrated frequency synthesizer modules are included in each chip that enable the generation of the required test and local-oscillator millimeter-wave signals. A measurement $3sigma $ statistical phase error lower than 0.3$\^{}{circ}$ is achieved. Automated measurement of changes in the dielectric properties of different materials is demonstrated using the proposed systems. The single- and dual-port network analyzer chips have a current consumption of 600 and 700 mA, respectively, drawn from a single 3.3-V supply.

Authors with CRIS profile

Ismail Nasr Lehrstuhl für Technische Elektronik Johannes Nehring Lehrstuhl für Technische Elektronik Georg Fischer Professur für Technische Elektronik Robert Weigel Lehrstuhl für Technische Elektronik Dietmar Kissinger Lehrstuhl für Technische Elektronik

Involved external institutions

Infineon Technologies AG DE Germany (DE)

How to cite

APA:

Nasr, I., Nehring, J., Aufinger, K., Fischer, G., Weigel, R., & Kissinger, D. (2014). Single- and Dual-Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors. IEEE Transactions on Microwave Theory and Techniques, 62(9), 2168-2179. https://doi.org/10.1109/TMTT.2014.2337264

MLA:

Nasr, Ismail, et al. "Single- and Dual-Port 50-100-GHz Integrated Vector Network Analyzers With On-Chip Dielectric Sensors." IEEE Transactions on Microwave Theory and Techniques 62.9 (2014): 2168-2179.

BibTeX: Download