Visualization of defect densities in reduced graphene oxide

Eigler S, Dotzer C, Hirsch A (2012)

Publication Type: Journal article, Original article

Publication year: 2012

Journal

Carbon Elsevier

Original Authors: Eigler S., Dotzer C., Hirsch A.

Publisher: Elsevier

Book Volume: 50

Pages Range: 3666-3673

Journal Issue: 10

DOI: 10.1016/j.carbon.2012.03.039

Abstract

Efficiently reducible graphene oxide (GO) was obtained, even if a high degree of functionalization is present. Graphite with few defects was used as starting material and oxidized according to Hummer's method. An extremely high I /I ratio for rGO of 2.8 (532 nm) was observed in the Raman spectrum as a consequence of the lower defect density in GO. It was also possible to demonstrate the impact of local defects on the structure in rGO by local laser exposure experiments on single graphene oxide flakes. Raman spectroscopy can visualize the laser impact by I /I ratio measurements. © 2012 Elsevier Ltd. All rights reserved.

Authors with CRIS profile

Siegfried Eigler Lehrstuhl für Organische Chemie II Christoph Dotzer Lehrstuhl für Organische Chemie II Andreas Hirsch Lehrstuhl für Organische Chemie II

Additional Organisation(s)

Exzellenz-Cluster Engineering of Advanced Materials (EAM)

How to cite

APA:

Eigler, S., Dotzer, C., & Hirsch, A. (2012). Visualization of defect densities in reduced graphene oxide. Carbon, 50(10), 3666-3673. https://doi.org/10.1016/j.carbon.2012.03.039

MLA:

Eigler, Siegfried, Christoph Dotzer, and Andreas Hirsch. "Visualization of defect densities in reduced graphene oxide." Carbon 50.10 (2012): 3666-3673.

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